| 高分辨双晶XRF测定硫的化学价态 |
| 摘要点击 2136 全文点击 2042 投稿时间：1995-01-20 |
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| 中文关键词 高分辨双晶X射线荧光光谱 谱峰能量 硫化学价态 |
| 英文关键词 HRXRE chemical valence state sulfur sulfur-bearing compounds energychange |
| DOI 10.13227/j.hjkx.19950513 |
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| 中文摘要 |
| 用高分辨双晶XRF法测定纯硫、亚硫酸盐、硫酸盐、硫化物等及部分未知样品中硫的比学价态,研究了疏的不同价态的谱峰能量差范围,并根据这个能量差范围判定未知作品中硫的化学价态。单种化学价态的硫标准样在经过XRF照射测定后其硫的化学价态基本无变化。各种不同价态硫的谱峰能量差范围为S6+:+1.10至+1.25(eV),S4+:+0.61至+0.93(eV),S2-:-0.12至-0.21(eV)。本法适用于单种化学态硫样品的分析。 |
| 英文摘要 |
| With a high resolution two crystal X-ray fluorescence (HRXRF) method,the chemical valence states of sulfur in pure elemental sulfur,sulfites,sulfates and sulfides and in some of unknown samples were determined,the range of energy differences of the spectral peaks for sulfur in different valence states were identified,and then the range of energy differences was used to identify the chemical valences of sulfur in unknown samples. Each of chemical valence states of sulfur in standard samples had essentially no change after they had been subjected to repeated HRXRF measurements. Sulfur in various chemical valence states had the following ranges of energy differences for spectral peaks:S6+,+1.10 to +1.25eV;S4+,+0.61 to +0.93eV; and S2-,-0.12 to -0.21eV. This method was found useful in the measurement of sulfur in a singlechemical valence state,and in the identification of different chemical valence states of sulfur. |
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